PR Team | 2025.02.04.
DAEIL SYSTEMS’ DVIA-ML Series is a highly advanced vibration isolation system designed to optimize the imaging performance of electron microscopes, leveraging world-leading vibration control technology. This system maximizes experimental accuracy and provides the ideal solution to effectively address the vibration challenges that electron microscopes often face.
By combining high-performance sensors, real-time data processing, and precision control algorithms, the DVIA-ML Series significantly improves electron microscope imaging quality. The system achieves over 90% vibration control performance at frequencies as low as 1Hz, actively detecting and managing vibrations across six degrees of freedom, including three translational movements (Z, X, Y axes) and three rotational movements (pitch, roll, yaw), which can occur in laboratory environments.
Equipped with 11 highly sensitive geophone velocity sensors (2.55 V/in/s, 100.4 V/m/s), the system effectively detects low-frequency vibrations, even as small as 0.3Hz. A high-performance digital signal processor (DSP) corrects vibrations in real time with a response time of less than 0.005 seconds, ensuring precise and real-time correction. This quick and accurate response assures that vibrations from a variety of sources are effectively controlled, keeping the electron microscope’s performance at its peak.
The DVIA-ML Series also incorporates a real-time feedforward control algorithm, further enhancing vibration isolation performance. This algorithm continuously collects vibration data from floor sensors and actively controls vibrations in real time, delivering stable, consistent performance without the need for frequent recalibration. The updated tuning software offers a wider range of filters and gain options, enabling more precise and accurate tuning adjustments.
A standout feature of the DVIA-ML Series is its feedforward D-gain control, which efficiently reduces vibrations in extremely low-frequency ranges below 0.5Hz. The system also features an open-loop transfer function starting from 1Hz, allowing precise phase margin assessment and stable gain adjustments.
With its low-profile platform design (173-178mm), the DVIA-ML Series is perfectly suited for laboratory environments with space limitations. Additionally, advanced notch filters effectively eliminate structural resonances and external vibration sources, providing customized vibration isolation tailored to the specific needs of electron microscopes.
DAEIL SYSTEMS’ DVIA-ML Series offers a differentiated vibration isolation solution that significantly improves electron microscope performance. With its innovative technology and unparalleled vibration control, it guarantees the highest quality imaging environment, enabling your research and analysis to achieve optimal results.