Case Studies
- PARK SYSTEM XE-100-01 AFM
- PERSONAL AFM
- AFM SILCON CANTILEVER IMAGING
- HOLOGRAPHINC MICROSCOPE
- 50nm RESOLUTION MICROSCOPE
- WHITE LIGHT INTERFEROMETER
PARK SYSTEM XE-100-01 AFM
Pneumatic Vibration Isolation Table Set point : 502.34 (nN)
Active Vibration Isolation Table(DVIA-T45) Set point : 563.25 (nN)
The line profile indicates that the nosie of the pneumatic vibration isolation tables is 10 times greater than the active vibration isolation table and the cause of exccessive noise of the XE-100-02 due to the vibration isolation performance difference between the pneumatic vibration isolation table and the active vibration isolation table. The AFM XE-100-01 confirms that it is possible to measure fine samples of the XE-100-02 with DAEIL SYSTEMS's tabletop active vibration isolation platform.
AFM
Active Vibration Isolation OFF
Active Vibration Isolation ON
Active Vibration Isolation OFF
Active Vibration Isolation ON
AFM SILCON CANTILEVER IMAGING
Analysis - frequency
Analysis - Standard Deviation
Imaging TEST in Different Substrate (Silicon Cantilever)
HOLOGRAPHINC MICROSCOPE
TOMOCUBE 3D HOLOGRAPHIC MICROSCOPE installed on DVIA-T56
Without active vibration isolation
With active vibration isolation
50nm RESOLUTION MICROSCOPE